This research introduces an Online Calibration Protocol (OCP-SIM) for Structured Illumination Microscopy (SIM) to address time-varying hardware degradation. The protocol includes a statistical degradation model, real-time Bayesian parameter estimation, and an adaptive correction framework to adjust reconstruction algorithms based on estimated degradation states, ensuring high-quality imaging without interrupting biological experiments.
Key findings
OCP-SIM continuously monitors and corrects for SIM hardware degradation during imaging sessions.
Integrates a statistical degradation model, real-time Bayesian parameter estimation, and adaptive correction framework.
Protocol operates without interrupting biological experiments using interleaved calibration measurements and computational feedback.
Limitations & open questions
The validation plan includes simulation benchmarks and controlled experiments but may require further validation in diverse real-world scenarios.