The paper introduces AERQ, a novel method for rapid characterization of noisy intermediate-scale quantum devices. It combines spectator-assisted amplification, adaptive estimation protocols, and real-time fidelity bounds to achieve high-precision device metrics with minimal resource overhead.
Key findings
AERQ leverages quantum metrology techniques for rapid, high-precision characterization of NISQ devices.
The method achieves up to O(√n) improvement in estimation precision compared to standard randomized benchmarking.
AERQ enables sub-second device characterization on 100+ qubit systems while maintaining rigorous uncertainty bounds.
Limitations & open questions
The method's scalability and performance under various noise models require further investigation.
The practical implementation on different quantum platforms may face additional challenges.